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Thermal Measurements AFM Presentation

Overview

Explain how Thermal measurements AFM (or scanning thermal microscopy (SThM) technique) works including appropriate illustrations (diagrams/pictures).

Describe the general setup of the instrument. Include diagrams. How does the device use a cantilever to probe the temperature and thermal conductivity of a material?

State and explain the signal that is used, its source, how it interacts with the material or the cantilever, and how it is collected and interpreted to give a temperature map and thermal conductivity of the material. describe the mathematical algorithm that is utilized in this process.

Use the links below as a guide and provide at least FIVE other sources/references (preferably books).

https://www.csinstruments.eu/afm-modes/thermal-mea...

https://www.bruker.com/en/products-and-solutions/m...

https://en.wikipedia.org/wiki/Scanning_thermal_mic...